FORMATION AND INVESTIGATION OF SCHOTTKY DIODES BASEDON PLATINUM AND NICKEL SILICIDE

Authors

  • M. I. Markevich State Scientific Institution “Physical-Technical Institute of National Academy of Sciences of Belarus”, 10, Kuprevich str., 220141 Minsk, the Republic of Belarus Автор
  • A. M. Chaplanov State Scientific Institution “Physical-Technical Institute of National Academy of Sciences of Belarus”, 10, Kuprevich str., 220141 Minsk, the Republic of Belarus Автор
  • A. N. Malyshko State Scientific Institution “Physical-Technical Institute of National Academy of Sciences of Belarus”, 10, Kuprevich str., 220141 Minsk, the Republic of Belarus Автор
  • V. A. Solodukha Open Joint-Stock Company “Integral”, 121 A, Kazintsa str., 220108 Minsk, the Republic of Belarus Автор
  • Ya. A. Solovyev Open Joint-Stock Company “Integral”, 121 A, Kazintsa str., 220108 Minsk, the Republic of Belarus Автор
  • O. E. Sarichev Open Joint-Stock Company “Integral”, 121 A, Kazintsa str., 220108 Minsk, the Republic of Belarus Автор
  • E. N. Shcherbakova Belorussian National Technical University, 65, Nezavisimosti ave., 220013 Minsk, the Republic of Belarus Автор

Keywords:

Schottky diode; thin films; platinum silicide; nickel silicide; current-voltage characteristics

Abstract

Schottky diodes are widely used in electronics systems. The article deals with the height of Shottky diode barrier formed on the
basis of NiV-Pt/Si thin film system in different annealing modes. Using the methods of electronography and X-ray microanalysis the
changes in elemental composition and phase transformations of these systems in the conditions of two-step stationary annealing under
nitrogen environment depending on exposure time and temperature are investigated.

Table 5. Fig. 5. Ref.: 5 titles.

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Published

2016-06-01

Issue

Section

МАШИНОСТРОЕНИЕ И МАШИНОВЕДЕНИЕ